TESCAN CLARA
Field-free analytical UHR SEM for materials
characterization at nanoscale.
- Uncompromised characterization of all types of materials at the nanoscale.
- Ideal for characterization of materials at low beam energies for maximum surface topography.
- Excellent imaging of beam-sensitive and non-conductive samples.
- Fully automated setup of electron beam – optimal imaging conditions are guaranteed by the In-Flight Beam Tracing™.
- Intuitive live SEM navigation on the sample at magnification as low as 2× without the need of extra optical navigation camera thanks to the Wide Field Optics™ design.
- Unique In-Beam Multidetector design allowing angle and energy selective BSE detection.
- Intuitive software modular platform designed for effortless operation regardless of users’ skill level.
