TESCAN CLARA

Field-free analytical UHR SEM for materials

characterization at nanoscale.

• Uncompromised characterization of all types of materials at the nanoscale.

• Ideal for characterization of materials at low beam energies for maximum surface topography.

• Excellent imaging of beam-sensitive and non-conductive samples.

• Fully automated setup of electron beam – optimal imaging conditions are guaranteed by the In-Flight Beam Tracing™.

• Intuitive live SEM navigation on the sample at magnification as low as 2× without the need of extra optical navigation camera thanks to the Wide Field Optics™ design.

• Unique In-Beam Multidetector design allowing angle and energy selective BSE detection.

• Intuitive software modular platform designed for effortless operation regardless of users’ skill level.