High resolution electron microscopes with x ray, and microtomography

Office phone +34 91 148 8267

Cellular phone +34 682 745 975 (click to call)

info@zeppelinmet.com

Business Park Europa Empresarial

C/Rozabella 8,

Edificio Paris, oficina 12

28250 Las Rozas (Madrid)

Materials science

Materials Science is a field which deals with the discovery and development of new materials and methods for their study. It is a multidisciplinary science involving different fields of knowledge such as physics, chemistry and engineering. Materials Science focuses on studying the most important characteristics of materials such as their mechanical, chemical, electrical, thermal, optical and magnetic properties. The field can be sub-divided into different disciplines including nanomaterials, organic materials, electronic/photonic materials, structural/composite materials and smart materials.

Steels and metal alloys

High resolution and large depth of focus are the main functions which make scanning electron microscope (SEM) a great tool for observing topographic features of samples made of steel and metal alloys.

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Contact layers under a solder ball imaged at 5 keV with the InBeam SE detector for topographic contrast (left), and the In-Beam f-BSE detector for material contrast (right).

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Contact layers under a solder ball imaged at 5 keV with the InBeam SE detector for topographic contrast (left), and the In-Beam f-BSE detector for material contrast (right).

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The beam deceleration improves imaging at low landing energies. Surface features in an Al flake become visible only at a landing energy of 500 eV (right). The multi-detector system enables simultaneous detection of BSE (left) and SE (right) signals.

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The beam deceleration improves imaging at low landing energies. Surface features in an Al flake become visible only at a landing energy of 500 eV (right). The multi-detector system enables simultaneous detection of BSE (left) and SE (right) signals.

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Image of an anode surface doped with Pt nanoparticles.

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Ceramics and hard coatings

Uncoated and non-conducting samples can be observed in the variable pressure mode without damaging the sample. Components made of ceramic materials are in some cases the only solution to technical problems that cannot be resolved with conventional materials.

Slide title

Contact layers under a solder ball imaged at 5 keV with the InBeam SE detector for topographic contrast (left), and the In-Beam f-BSE detector for material contrast (right).

Button
Slide title

Contact layers under a solder ball imaged at 5 keV with the InBeam SE detector for topographic contrast (left), and the In-Beam f-BSE detector for material contrast (right).

Button
Slide title

The beam deceleration improves imaging at low landing energies. Surface features in an Al flake become visible only at a landing energy of 500 eV (right). The multi-detector system enables simultaneous detection of BSE (left) and SE (right) signals.

Button
Slide title

The beam deceleration improves imaging at low landing energies. Surface features in an Al flake become visible only at a landing energy of 500 eV (right). The multi-detector system enables simultaneous detection of BSE (left) and SE (right) signals.

Button
Slide title

Image of an anode surface doped with Pt nanoparticles.

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Glass

TESCAN SEMs are of great benefit to the glass industry. Glass and its derived products are an important part of automotive, construction, engineering and energy industry, among others.

Slide title

Contact layers under a solder ball imaged at 5 keV with the InBeam SE detector for topographic contrast (left), and the In-Beam f-BSE detector for material contrast (right).

Button
Slide title

Contact layers under a solder ball imaged at 5 keV with the InBeam SE detector for topographic contrast (left), and the In-Beam f-BSE detector for material contrast (right).

Button
Slide title

The beam deceleration improves imaging at low landing energies. Surface features in an Al flake become visible only at a landing energy of 500 eV (right). The multi-detector system enables simultaneous detection of BSE (left) and SE (right) signals.

Button
Slide title

The beam deceleration improves imaging at low landing energies. Surface features in an Al flake become visible only at a landing energy of 500 eV (right). The multi-detector system enables simultaneous detection of BSE (left) and SE (right) signals.

Button
Slide title

Image of an anode surface doped with Pt nanoparticles.

Button

Polymers and Composites

High resolution and large depth of focus are capabilities that make TESCAN SEMs excellent instruments to observe polymers, plastic and other composite materials.

Slide title

Contact layers under a solder ball imaged at 5 keV with the InBeam SE detector for topographic contrast (left), and the In-Beam f-BSE detector for material contrast (right).

Button
Slide title

Contact layers under a solder ball imaged at 5 keV with the InBeam SE detector for topographic contrast (left), and the In-Beam f-BSE detector for material contrast (right).

Button
Slide title

The beam deceleration improves imaging at low landing energies. Surface features in an Al flake become visible only at a landing energy of 500 eV (right). The multi-detector system enables simultaneous detection of BSE (left) and SE (right) signals.

Button
Slide title

The beam deceleration improves imaging at low landing energies. Surface features in an Al flake become visible only at a landing energy of 500 eV (right). The multi-detector system enables simultaneous detection of BSE (left) and SE (right) signals.

Button
Slide title

Image of an anode surface doped with Pt nanoparticles.

Button

Material for building and civil engineering

Scanning electron microscopy has been an essential analytical technique for studying a variety of construction materials.

Slide title

Contact layers under a solder ball imaged at 5 keV with the InBeam SE detector for topographic contrast (left), and the In-Beam f-BSE detector for material contrast (right).

Button
Slide title

Contact layers under a solder ball imaged at 5 keV with the InBeam SE detector for topographic contrast (left), and the In-Beam f-BSE detector for material contrast (right).

Button
Slide title

The beam deceleration improves imaging at low landing energies. Surface features in an Al flake become visible only at a landing energy of 500 eV (right). The multi-detector system enables simultaneous detection of BSE (left) and SE (right) signals.

Button

Wood, Textile and Paper

Scanning electron microscopy has been an essential analytical technique for studying a variety of construction materials.

Slide title

Contact layers under a solder ball imaged at 5 keV with the InBeam SE detector for topographic contrast (left), and the In-Beam f-BSE detector for material contrast (right).

Button
Slide title

Contact layers under a solder ball imaged at 5 keV with the InBeam SE detector for topographic contrast (left), and the In-Beam f-BSE detector for material contrast (right).

Button
Slide title

The beam deceleration improves imaging at low landing energies. Surface features in an Al flake become visible only at a landing energy of 500 eV (right). The multi-detector system enables simultaneous detection of BSE (left) and SE (right) signals.

Button
Slide title

The beam deceleration improves imaging at low landing energies. Surface features in an Al flake become visible only at a landing energy of 500 eV (right). The multi-detector system enables simultaneous detection of BSE (left) and SE (right) signals.

Button
Slide title

Image of an anode surface doped with Pt nanoparticles.

Button

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CONTACT

Office: +34 91 148 8267

Cell. +34 682 715 975 info@zeppelinmet.com

Address:

Business Park Europa Empresarial

C/Rozabella 8,

Edificio Paris, oficina 12

28250 Las Rozas (Madrid)

Materials science

Steels and metal alloys

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Ceramics and hard coatings

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Glass

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Polymers and Composites

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Material for building and civil engineering

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Wood, Textile and Paper

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