TESCAN CLARA CRYO

• High-resolution and high-contrast imaging of nextgen materials (e.g. catalyst structures, nanotubes, nanoparticles and other nanoscale structures).

• Excellent platform suitable for SEM/STEM metrology at sub-nanometer scale.

• Fast setup of the electron beam – optimal imaging conditions are guaranteed by the In-Flight Beam Tracing™.

• Multi-detector system TriBE™ and TriSE™ for sample nanocharacterization.

• Intuitive software modular platform designed for effortless operation regardless users’ skill level