SuperView W3

The SuperView W3 3D optical surface profilometer is an ideal instrument for sub-nanometer measurements of various precision parts. Based on the principle of white light interference technology, combined with a precision Z-direction scanning module and a 3D modeling algorithm, it scans the object's surface without contact and generates a 3D image of it.


After processing and analyzing the 3D image using XtremeVision software, a series of 2D and 3D parameters are obtained that reflect the surface quality of the object. The SuperView W3 is an easy-to-use precision optical instrument with powerful analysis functions for all types of surface shape and roughness parameters. Thanks to its unique light source, it can measure various precision parts with both smooth and rough surfaces.


- Standard field of view: 0.98 x 0.98 mm

- RMS roughness repeatability: 0.005 nm

- Scanning range: 10 mm

- Resolution: 0.1 nm

- Scenario measurement accuracy: 0.3%

- Repeatability of the stage measurement: 0.08% 1σ


Dedicated functions for the semiconductor field

  • Measure the profile trenches after laser grooving in the cutting process.
  • Measure the wafer film pitch height in a range of 1 nm to 1 mm.
  • Measure the roughness of the cut silicon sheet after the polishing process and you can measure
  • dozens of small areas to get the average value with one click.
  • It supports measuring 6", 8", and 12" wafers and easily switches between 3 sizes.
  • One-click vacuum mandrels automatically.


Applications

It is used for measuring and analyzing the surface roughness and profile of precision components in the semiconductor, 3C electronics, ultra-precision machining, optical machining, micro-nano materials and microelectromechanical systems industries.

Measurement and analysis of the surface shape and profile characteristics of various products, components and materials, such as flatness, roughness, waviness, appearance, surface defects, abrasion, corrosion, gaps, holes, stages, curvature, deformation, etc.

3C Electronics - Sapphire Crystal

Features . .. ...
Model No. SuperView W3
Size 1000*900*1550 mm
Weight 500 kilos
Light source LED blanco
Video system 1024×1024
Objective lens 10x (2.5x, 5x, 20x, 50x, 100x optional)
Optical zoom 0.5x (0.75x, 1x, 0.375x optional)
Standard field of view 0,98 × 0,98 mm
Lens turret 5-hole motorized turret
XY object table Size 450×450 mm
Travel range 300×300 mm
Load capacity 10 kilos
Control Method - Motorized
Tilt ±5° motorized
Z-axis Travel range 100 mm
Control Method - Motorized
Z-Stoke scan range 10 mm
Resolution Z 0,1 nm
RMS Roughness Repeatability 0,005 nm
Measuring the height of the stage Accuracy 0.3%
Repeatability 0.08% 1σ
Environmental requirement
1 Operating environment: No strong magnetic field 4 Ambient vibration: VC-C or better
2 Operating temperature: 0 °C ~ 30 °C fluctuation <2 °C/60 min 5 Compressed air: 0.6 MPa oil-free, water-free
3 Relative humidity: 5%~95% RH, non-condensing 6 Power: 300W

You may also be interested in:

Talk later?

Do you have any questions? We're here to help. Send us a message and we'll get back to you.

Contact us