Interferometric Profilers

Chotest Technology Inc.'s Nano 3D Optical Surface Profilometers represent an advanced solution for three-dimensional surface analysis with nanometer resolution. These non-contact optical measurement systems utilize technologies such as interferometry and focus variation analysis to accurately capture surface topography, enabling the creation of detailed 3D maps and comprehensive surface roughness and texture parameters.

Thanks to their high precision, rapid acquisition, and metrological stability, the profilometers in this series allow for the analysis of complex microstructures and surface features without risk of damaging the measured part. Their powerful software facilitates data processing, three-dimensional visualization, and the generation of comprehensive reports for quality control.

The Nano 3D series instruments are widely used in sectors such as microelectronics, semiconductors, precision optics, materials research, and advanced manufacturing. Their combination of high-performance optical technology and ease of use makes them an ideal tool for laboratories and industrial environments requiring extremely precise surface measurements.