Contact us
Office phone +34 91 148 8267
Cellular phone +34 682 745 975 (click to call)
info@zeppelinmet.com
Business Park Europa Empresarial
C/Rozabella 8,
Edificio Paris, oficina 12
28250 Las Rozas (Madrid)
The next generation desktop SEM
A true analytical benchtop scanning electron microscope.
NANOS offers SEM imaging at a low cost of ownership for high-resolution imaging and integrated Energy Dispersive Spectroscopy (EDS) for rapid elemental analysis. It is designed for easy installation, ease of use and easy maintenance.
The NANOS is a complete and affordable benchtop scanning electron microscope (SEM). It is designed using the latest technology, delivering fast, high-quality SEM images and elemental analysis. Its design is robust and modern, which makes it perfect for research and development, educational and industrial use.
Setting
The NANOS is delivered with integrated BSD, SED, EDS and an eucentric tilt stage.
Design
The NANOS has a modern and robust design and is designed with the latest materials and components.
Service
The NANOS design allows for easy access for maintenance and upgrades that can be completed at your facility.
Robust
With excellent stability and a small footprint, the architecture of the NANOS ensures that it can be used in non-laboratory environments.
Easy to use
In BASIC mode, NANOS will produce results in a short period of time, regardless of experience. ADVANCED mode provides additional features for detailed analysis.
Cost of ownership
The NANOS has been designed to keep the cost of ownership lower than any currently available benchtop SEM.
Iconic dutch design
Designed and manufactured in the Netherlands, it's all about reliability, quality and ease of use.
GENERAL SPECIFICATIONS
SOFTWARE | optical | Magnification range: 2 – 12x |
---|---|---|
WHICH | Magnification range: 50 - 200,000x | |
Resolution | <10 nm | |
LIGHTNING | optical | clear field |
WHICH | Optimized thermoionic source (tungsten) | |
Acceleration stresses | Default: 1, 2, 5, 7, 10, 15, and 20 kV | |
Adjustable range between 1 and 20 kV | ||
DETECTOR | Secondary Electron Detector (SED) | |
Energy Dispersive Spectroscopy (EDS) Detector: Integrated | ||
DIGITAL IMAGE DETECTION | optical | color navigation camera |
IMAGE FORMATS | JPEG, TIFF, PNG, BMP | |
USER INTERFACE | Communication, imaging and analysis use a single monitor with control via a wireless mouse and keyboard. Remote control (for example, iPad) enabled Basic and advanced modes | |
DATA STORAGE | Network, USB, workstation | |
SAMPLE STAGE | Eucentric tilt stage (-15 to 40 ̊) | |
Computer controlled motorized X, Y: 25 x 25 mm | ||
SAMPLE SIZE | 25mm diameter pin trunnion | |
Round disk of 60 mm in diameter. | ||
EDS SPECIFICATIONS | detector type | Silicon Drift Detector (SDD), thermoelectrically cooled |
detector active area | 30mm2 _ | |
energy resolution | @ Mn Kα < 133 eV | |
Max input count rate | 300.000 cps | |
hardware integration | fully integrated | |
SOFTWARE | Integrated into the NANOS user interface | |
EDS analysis and mapping. | ||
export functions | ||
SYSTEM SPECIFICATIONS | imaging module | 280 (width) x 630 (depth) x 550 (height) All-in-One PC preconfigured with 27” monitor. SEM imaging and EDS analysis software installed |
Weight | 60 kilograms | |
Zapatillas | Turbomolecular pump with oil-free diaphragm pre-vacuum pump | |
vacuum modes | High vacuum SEM (conventional SEM) and 0.4 mbar low vacuum (low vacuum SEM) |
Experience the NANOS
Eucentric stage
The NANOS Eucentric Stage is truly the only one of its kind. It comes standard with the NANOS. Motorized XY movements can be controlled through the user interface. Tilt of the sample while in SEM mode can be done by manually rotating the stage. Thanks to the eucentric design, the sample remains in focus without the need for intermediate changes to the SEM setup. The user interface indicates the exact tilt angle. Specimens can be tilted up to 55 ̊ angles.
Elemental analysis
The NANOS is equipped with a fully integrated energy dispersive X-ray (EDX) silicon drift detector (SDD). Through the user interface, the operator can select EDX Point Analysis or activate Elemental Mapping.
Electron detectors
The NANOS comes with a Secondary Electron Detector (SED) and a Backscattered Electron Detector (BSD) as standard. The BSD is a 4-quadrant detector with fully controllable independent segments. By using the segments in different combinations, it provides compositional or topographical details of the specimen, as well as images with a "shadow effect" by highlighting the surface from multiple directions.