TESCAN AMBER

Versatile nanoanalytical FIB-SEM to expand your materials research capabilities

TESCAN AMBER is designed with a focus on versatility, covering both sample characterization at the nanoscale, and everyday FIB applications in the materials research lab. The synergy of its field free ultra-high-resolution SEM and state-of-the art Ga+ FIB, makes TESCAN AMBER a preferred solution for high precision microsample preparation and advanced materials characterization.

• High precision micro sample preparation
• Ultra-high resolution field-free SEM imaging and nanoanalysis
• Extended field of view and easy navigation
• Multi-site process automation
• Multi-modal FIB-SEM tomography
• Easy-to-use modular software user interface
• Attractive optional packages for various applications