SJ5720-OPT200
The SJ5720-OPT allows for surface roughness and profile measurement in a single scan. It also features a dedicated software module for measuring and analyzing large aspherical surfaces, making it an ideal measurement solution for the optical lens industry.
It can also be used to measure profiles and roughness on large curved surfaces, such as bearings, artificial joints, precision molds, gears, blades, etc. Consequently, it is widely used in precision machining, automotive, bearing, machine tool, mold, precision hardware, and other industries.
Functions
1. Evaluate the profile and roughness parameters simultaneously after scanning once.
2. High precision, high stability and high repeatability.
3. Aspheric optical software module
4. Intelligent management system and advanced software analysis
5. Intelligent protection system during scanning.
6. Control manual flexible
7. High stability vibration isolation system.
Applications
Spring
Intraocular lens mold
Vehicle lens
Infrared lens
Optical mold
Lente
Software
Professional software for measuring aspheric surfaces can analyze all parameters of aspheric surfaces.
There are some self-checking parameters in the software, so the accuracy of the input formula can be determined by self-checking.
| Features | |
|---|---|
| Model No. | SJ5720-OPT200 |
| Profile measurement | Measurement range |
| WITH | X 0~200 mm |
| Z1 | Z 0~500 mm |
| Z1 ±6 mm (opcional: ±12 mm) | |
| Resolution 0.001 um | |
| Accuracy | Z1 ≤±（0,5 0,03 H）μm（H,mm） |
| Pt ≤0,2 μm | |
| Standard ball * ≤±(1 R/20)μm (R,mm) | |
| Angle * ≤±1′ | |
| Speed of movement | X 0~20 mm/s |
| Z 0~20 mm/s | |
| Scanning speed 0.05~5 mm/s | |
| X Rectitud * ≤0,25 μm/200 mm | |
| Force measurement: 0.5 mN, 0.75 mN, 1 mN, 2 mN, 3 mN (adjustable) | |
| Roughness measurement | Measurement range Ra - Ra0.012 μm~Ra12.5 μm |
| Accuracy * Ra0.012 μm ~ Ra3.2 μm: ≤±(3 nm+2.0 % A), A(Ra)μm | |
| Repeatability (1δ) * 1δ≤1 nm | |
| Measurement residual * Rq≤3 nm | |
| Roughness parameters - Roughness R: Rp, Rv, Rz, Rc, Rt, Ra, Rq, Rsk, Rku, RSm, RPc, Rdq, Rdc, Rmr, Rmax, Rpm, tp, Htp, Pc, Rda, Ry, Sm, S, Rpq, Rvq, Rmq, RzJ, Rv1max, Rp1max, Rz1max, Rmr(Rz/4), maxRa, R5z, R3z, Rh, Dq, Lq, SD | |
| Aspheric measurement parameters - Microprofile parameters: Pt, Pa, Fig; Tilt parameters: Smx, Smn; Horizontal axis angle parameter: Tilt; Optical axis to contour distance parameters: Xp, Xv, Xt; Root mean square roughness parameter: RMS; Slope parameters: Slpe mx, Slpemx (x), Slperms; Vertex radius error parameter: Radius Err | |
| Filter - Gaussian filter, 2RC filter, zero-phase filter | |
| Sampling length - 0.008, 0.08, 0.25, 0.8, 2.5, 8.0 or 25 mm selectable | |
| Evaluation duration - Automatic calculation | |
| Size (length x width x height) | 800×500×1080(mm) |
| Weight | 265 kilos |
*1 Accuracy is based on the measuring gauge block.*2 Accuracy is based on the Pt test of a standard ball with a diameter less than 25 mm.*3 Accuracy is based on the verification of a 50 mm diameter standard ball with an arc exceeding 90 degrees.*4 Accuracy is based on the measurement of the angle of a polygonal prism.*5 Accuracy is based on the measurement of the optical plane.*6 Accuracy is based on the measurement of the standard roughness block.*7 Repeatability is based on the measurement of a 0.1–0.2 μm square wave roughness block and a standard step height block.*8 Accuracy is based on the measurement of a 1 nm level roughness block and an optical plane.
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